The atomic force microscope (AFM) is an analytical instrument used to study the surface structure of solid materials, including insulators. It utilizes a microcantilever to sense and amplify the forces between a sharp probe on the cantilever and the atoms of the sample being tested, thereby achieving atomic-level resolution.
How to choose a high-performance AFM microscope?
1、Personalized customization to meet different needs
*It supports multiple working modes and multiple functional module expansions to meet most basic scientific research applications.
*It has an open structural design to support more customized function options.
2、Perfect combination of excellent experience and high precision
*XYZ three-axis independent closed-loop piezoelectric ceramic scanner achieves high-precision positioning and high-resolution scanning measurement at the same time
*Closed-loop piezoelectric ceramic scanning measurement does not require nonlinear correction, and the nanometer characterization and measurement accuracy is better than 99.5%.
3、Standard imaging modes
Contact mode, tapping mode, phase imaging, lateral force mode (LFM)
4、Mechanical measurement mode
F-Z force curve, RMS-Z curve, advanced force spectrum imaging, mechanical mapping measurement
5、Electrical measurement modes
Electrostatic force mode (EFM), conductive force mode (C-AFM), Kelvin probe force mode (KPFM), piezoelectric force mode (PFM), scanning resistance mode (SSRM), scanning capacitance mode (SCM)
6、Optical auxiliary function
It can be used with stereo microscope, upright metallographic microscope, inverted biological microscope.
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